Percorrer por assunto Raman spectroscopy

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DataTítuloAutor(es)TipoAcesso
14-Abr-2011Low-temperature fabrication of layered self organized ge clusters by RF-sputteringPinto, S. R. C.; Rolo, Anabela G.; Buljan, M., et al.ArtigoAcesso aberto
Jan-2001Low-wavenumber Raman scattering in glycerolMoura, C.; Zwick, A.ArtigoAcesso aberto
14-Ago-2004Mechanical and morphological characterization of polymer–carbon nanocomposites from functionalized carbon nanotubesPaiva, M. C.; Zhou, B.; Fernando, K. A. S., et al.ArtigoAcesso restrito UMinho
1995Microcrystalline silicon thin films prepared by RF reactive magnetron sputter depositionCerqueira, M. F.; Andritschky, M.; Rebouta, L., et al.ArtigoAcesso aberto
1997One-phonon Raman scattering from arrays of semiconductor nano-crystalsVasilevskiy, Mikhail; Rolo, Anabela G.; Gomes, M. J. M.ArtigoAcesso aberto
20-Mar-2012Physical and mechanical characterization of nanocomposites with carbon nanotubes functionalized with the matrix polymerPaiva, M. C.; Zhou, B.; Fernando, K. A. S., et al.ArtigoAcesso restrito UMinho
2018Piezoresistive polymer blends for electromechanical sensor applicationsCosta, P.; Oliveira, J.; Horta-Romarís, L., et al.ArtigoAcesso restrito UMinho
2014Piezoresistor sensor fabrication by direct laser writing on hydrogenated amorphous siliconAlpuim, P.; Cerqueira, M. F.; Noh, J., et al.ArtigoAcesso aberto
2007Quantum chemical DFT and spectroscopic UV-Vis-NIR analysis of a series of push-pull oligothiophenes end capped by amino-cyanovinyl groupsOliva, M. M.; Delgado, M. C. R.; Casado, J., et al.ArtigoAcesso aberto
2004Raman analysis of Si–C–N films grown by reactive magnetron sputteringLiang, E. J.; Zhang, J. W.; Leme, J., et al.ArtigoAcesso aberto
2017Raman and IR-ATR spectroscopy studies of heteroepitaxial structures with a GaN:C top layerCerqueira, M. F.; Vieira, L. G.; Alves, A., et al.ArtigoAcesso aberto
Set-2015Raman study of insulating and conductive ZnO: (Al, Mn) thin filmsCerqueira, M. F.; Viseu, T. M. R.; Campos, J. Ayres de, et al.ArtigoAcesso aberto
2011Resonant raman scattering in ZnO : Mn and ZnO: Mn : Al thin films grown by RF sputteringCerqueira, M. F.; Vasilevskiy, Mikhail; Oliveira, Fernando, et al.ArtigoAcesso aberto
24-Jul-2017SiGe layer thickness effect on the structural and optical properties of well-organized SiGe/SiO2 multilayersVieira, E. M. F.; Toudert, J.; Rolo, Anabela G., et al.ArtigoAcesso restrito UMinho
2012Structural and electrical studies of ultrathin layers with Si0.7Ge0.3 nanocrystals confined in a SiGe/SiO2 superlatticeVieira, E. M. F.; Martín-Sánchez, J.; Rolo, Anabela G., et al.ArtigoAcesso restrito UMinho
2010Structural and Raman characterization of nanogranular BaTiO3-NiFe2O4 thin films deposited by laser ablation on Si/Pt substratesGonçalves, J. R.; Barbosa, José Gusman; Sá, P., et al.Artigo em ata de conferênciaAcesso aberto
1998Structural properties of Ge nano-crystals embedded in SiO2 films from X-ray diffraction and Raman spectroscopyRolo, Anabela G.; Vasilevskiy, Mikhail; Conde, O., et al.ArtigoAcesso restrito UMinho
31-Out-2011Structure and chemical bonds in reactively sputtered black Ti–C–N–O thin filmsChappé, J. M.; Marco de Lucas, M. C.; Cunha, L., et al.ArtigoAcesso aberto
2009Study on the thermal stability of Ti(C,O,N) decorative coatingsMoura, C.; Cunha, L.; Chappé, J. M., et al.ArtigoAcesso aberto
2021The role of Ga and Bi doping on the local structure of transparent zinc oxide thin filmsCorreia, Filipe Costa; Ribeiro, Joana Margarida Fernandes Silva; Kuzmin, Alexei, et al.ArtigoAcesso restrito UMinho