Utilize este identificador para referenciar este registo:
https://hdl.handle.net/1822/1565| Título: | Microstructural characterisation of gamma-TiAl joints |
| Autor(es): | Guedes, A. Pinto, A. M. P. Vieira, M. F. Viana, Filomena Vieira, M. T. Ramos, A. S. |
| Palavras-chave: | TiAl Joining Brazing |
| Data: | 2002 |
| Editora: | Trans Tech Publications |
| Revista: | Key Engineering Materials |
| Citação: | "Key engineering materials". ISSN 1013-9826. 230-232 (2002) 27-30. |
| Resumo(s): | The joining of a gamma-TiAl alloy using Incusil-ABA as filler metal was investigated. Bonding was performed in a high vacuum furnace at 750 ºC for 10 min. The interfacial microstructure was analysed by SEM and its composition was investigated by EDS. An intense diffusion of Ti and Al to the interface and a strong reaction between the braze alloy and the base metal were observed. The interface could be divided into two distinct zones: (1) the reaction layer located near the base metal, essentially composed by Cu-Al-Ti compounds and (2) the central zone of the interface that corresponds to an (Ag) solid solution in which Cu-Al-Ti compounds are dispersed. |
| Tipo: | Artigo em ata de conferência |
| URI: | https://hdl.handle.net/1822/1565 |
| ISBN: | 0878499059 |
| ISSN: | 1013-9826 |
| Arbitragem científica: | yes |
| Acesso: | Acesso aberto |
| Aparece nas coleções: | CIICS - Artigos em revistas de circulação internacional com arbitragem científica DEM - Artigos em revistas de circulação internacional com arbitragem científica |
Ficheiros deste registo:
| Ficheiro | Descrição | Tamanho | Formato | |
|---|---|---|---|---|
| Materiais 2001.pdf | 306,22 kB | Adobe PDF | Ver/Abrir |
