Utilize este identificador para referenciar este registo: https://hdl.handle.net/1822/9081

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Campo DCValorIdioma
dc.contributor.authorCarvalho, Vítor-
dc.contributor.authorCardoso, Paulo-
dc.contributor.authorBelsley, M.-
dc.contributor.authorVasconcelos, Rosa-
dc.contributor.authorSoares, Filomena-
dc.date.accessioned2009-05-11T17:01:37Z-
dc.date.available2009-05-11T17:01:37Z-
dc.date.issued2006-
dc.identifier.citationCARVALHO, Vítor [et al.] - Developed of a yarn evenness measurement and hairiness analysis system. In ANNUAL CONFERENCE OF THE IEEE INDUSTRIAL ELECTRONICS SOCIETY, 32, Paris, France, 2006 – “IECON’06 : proceedings” [CD-ROM]. [S.l.] : IEEE, cop. 2006. ISBN 1-4244-0136-4. p. 3621-3626.en
dc.identifier.isbn9781424401352por
dc.identifier.issn1553-572Xpor
dc.identifier.urihttps://hdl.handle.net/1822/9081-
dc.description.abstractThis paper presents an automatic yarn characterization system, based on capacitive sensors for evenness measurement and on capacitive sensors for hairiness analysis. This approach enables direct yarn mass determination in 1mm range for evenness, an increase by a factor of eight over the most common comercial solutions (8mm), and will also enable hairiness measurementup to 1mm with high accuracy. This system determines all parameters commonly used in textile industry, for different sensitive values defined by the operator. It also presents new parameters, not measured by commercial equipments 8 integral deviation rate-IDR, different signal processing techniques to detect error patterns (Fast Walsh-hadanard transform-FWHT) and other adapted parametrs (desviation rate-DR, Spectrograms 8Fast Fourier Transform-FFT), Coefficient of Variation-CV, Mean Deviation-U, number and lenght of faults).en
dc.description.sponsorshipFundação para a Ciência e a Tecnologia (FCT) - BD/19028/2004por
dc.language.isoengen
dc.publisherIEEEen
dc.rightsopenAccessen
dc.titleDevelopment of a yarn evenness measurement and hairiness analysis systemen
dc.typeconferencePaperen
dc.peerreviewedyesen
sdum.pagination3621-3626en
sdum.publicationstatuspublisheden
oaire.citationConferenceDate07 - 10 Nov.en
sdum.event.locationParis, Franceen
sdum.event.title32nd Annual Conference of the IEE Industrial Electronics Society (IECON'06)en
sdum.event.typeconferenceen
oaire.citationStartPage971por
oaire.citationEndPage+por
dc.identifier.doi10.1109/IECON.2006.347502por
dc.subject.wosScience & Technologypor
sdum.journalIEEE Open Journal of the Industrial Electronics Societypor
sdum.conferencePublicationIECON 2006 - 32ND ANNUAL CONFERENCE ON IEEE INDUSTRIAL ELECTRONICS, VOLS 1-11por
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