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https://hdl.handle.net/1822/9081
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Campo DC | Valor | Idioma |
---|---|---|
dc.contributor.author | Carvalho, Vítor | - |
dc.contributor.author | Cardoso, Paulo | - |
dc.contributor.author | Belsley, M. | - |
dc.contributor.author | Vasconcelos, Rosa | - |
dc.contributor.author | Soares, Filomena | - |
dc.date.accessioned | 2009-05-11T17:01:37Z | - |
dc.date.available | 2009-05-11T17:01:37Z | - |
dc.date.issued | 2006 | - |
dc.identifier.citation | CARVALHO, Vítor [et al.] - Developed of a yarn evenness measurement and hairiness analysis system. In ANNUAL CONFERENCE OF THE IEEE INDUSTRIAL ELECTRONICS SOCIETY, 32, Paris, France, 2006 – “IECON’06 : proceedings” [CD-ROM]. [S.l.] : IEEE, cop. 2006. ISBN 1-4244-0136-4. p. 3621-3626. | en |
dc.identifier.isbn | 9781424401352 | por |
dc.identifier.issn | 1553-572X | por |
dc.identifier.uri | https://hdl.handle.net/1822/9081 | - |
dc.description.abstract | This paper presents an automatic yarn characterization system, based on capacitive sensors for evenness measurement and on capacitive sensors for hairiness analysis. This approach enables direct yarn mass determination in 1mm range for evenness, an increase by a factor of eight over the most common comercial solutions (8mm), and will also enable hairiness measurementup to 1mm with high accuracy. This system determines all parameters commonly used in textile industry, for different sensitive values defined by the operator. It also presents new parameters, not measured by commercial equipments 8 integral deviation rate-IDR, different signal processing techniques to detect error patterns (Fast Walsh-hadanard transform-FWHT) and other adapted parametrs (desviation rate-DR, Spectrograms 8Fast Fourier Transform-FFT), Coefficient of Variation-CV, Mean Deviation-U, number and lenght of faults). | en |
dc.description.sponsorship | Fundação para a Ciência e a Tecnologia (FCT) - BD/19028/2004 | por |
dc.language.iso | eng | en |
dc.publisher | IEEE | en |
dc.rights | openAccess | en |
dc.title | Development of a yarn evenness measurement and hairiness analysis system | en |
dc.type | conferencePaper | en |
dc.peerreviewed | yes | en |
sdum.pagination | 3621-3626 | en |
sdum.publicationstatus | published | en |
oaire.citationConferenceDate | 07 - 10 Nov. | en |
sdum.event.location | Paris, France | en |
sdum.event.title | 32nd Annual Conference of the IEE Industrial Electronics Society (IECON'06) | en |
sdum.event.type | conference | en |
oaire.citationStartPage | 971 | por |
oaire.citationEndPage | + | por |
dc.identifier.doi | 10.1109/IECON.2006.347502 | por |
dc.subject.wos | Science & Technology | por |
sdum.journal | IEEE Open Journal of the Industrial Electronics Society | por |
sdum.conferencePublication | IECON 2006 - 32ND ANNUAL CONFERENCE ON IEEE INDUSTRIAL ELECTRONICS, VOLS 1-11 | por |
Aparece nas coleções: | DET/2C2T - Comunicações em congressos internacionais com arbitragem científica |
Ficheiros deste registo:
Ficheiro | Descrição | Tamanho | Formato | |
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Developed of a yarn eveness measurement and hairiness analysis system.pdf | 317,93 kB | Adobe PDF | Ver/Abrir |