Utilize este identificador para referenciar este registo:
https://hdl.handle.net/1822/8629
Título: | Application of X-ray microtomography to the microstructural characterization of Al-based functionally graded materials |
Autor(es): | Velhinho, A. Fernandes, F. M. Braz Ferreira, S. C. Rocha, L. A. Vignoles, G. Cloetens, P. |
Palavras-chave: | Composites |
Data: | 2006 |
Editora: | Trans Tech Publications |
Revista: | Advances in Science and Technology |
Citação: | "Advances in Science and Technology". ISSN 1662-8969. 45 (2006) 1109-1116. |
Resumo(s): | This paper provides a brief overview of the possibilities offered by X-ray computed microtomography, and particularly synchrotron radiation X-ray microtomography, regarding metal matrix composite characterization, emphasis being placed in the case of Al-based functionally graded materials. Examples are provided concerning the characterization of the reinforcement population, interfacial properties, in-situ transformation and damage evolution. The specific needs of the technique and limitations to its widespread use are mentioned. |
Tipo: | Artigo em ata de conferência |
URI: | https://hdl.handle.net/1822/8629 |
ISSN: | 1662-8969 |
Arbitragem científica: | yes |
Acesso: | Acesso aberto |
Aparece nas coleções: | CIICS - Artigos em revistas de circulação internacional com arbitragem científica |
Ficheiros deste registo:
Ficheiro | Descrição | Tamanho | Formato | |
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Microtomography applications to Al FGMs.pdf | 781,15 kB | Adobe PDF | Ver/Abrir |