Strain dependence electrical resistance and cohesive strength of ITO thin films deposited on electroactive polymer

doi:10.1016/j.tsf.2009.12.022

Utilize este identificador para referenciar este registo: https://hdl.handle.net/1822/61340

Registo completo

Campo DC	Valor	Idioma
dc.contributor.author	Rebouta, L.	por
dc.contributor.author	Rubio-Peña, L.	por
dc.contributor.author	Oliveira, C.	por
dc.contributor.author	Lanceros-Méndez, S.	por
dc.contributor.author	Tavares, C. J.	por
dc.contributor.author	Alves, E.	por
dc.date.accessioned	2019-09-09T11:24:50Z	-
dc.date.available	2019-09-09T11:24:50Z	-
dc.date.issued	2010-06-01	-
dc.identifier.issn	0040-6090	por
dc.identifier.uri	https://hdl.handle.net/1822/61340	-
dc.description.abstract	Transparent, conducting, indium tin oxide (ITO) films have been deposited, by pulsed dc magnetron sputtering, on glass and electroactive polymer (poly(vinylidene fluoride)-PVDF) substrates. Samples have been prepared at room temperature by varying the oxygen partial pressure. Electrical resistivity around 8.4 x 10(-4) Omega cm has been obtained for films deposited on glass, while a resistivity of 1.7 x 10(-3) Omega cm has been attained in similar coatings on PVDF. Fragmentation tests were performed on PVDF substrates with thicknesses of 28 mu m and 110 mu m coated with 40 nm ITO layer. The coating's fragmentation process was analyzed and the crack onset strain and cohesive strength of ITO layers were evaluated.	por
dc.description.sponsorship	The authors appreciate the funding from the Portuguese Foundation for Science and Technology (FCT) (Grant PTDC/CTM/69316/2006) and INL project 156: SIMBIO.	por
dc.language.iso	eng	por
dc.publisher	Elsevier Science SA	por
dc.relation	info:eu-repo/grantAgreement/FCT/5876-PPCDTI/69316/PT	por
dc.rights	openAccess	por
dc.subject	Tensile test	por
dc.subject	ITO	por
dc.subject	Cohesive strength	por
dc.subject	Crack onset strain	por
dc.subject	Electroactive polymers	por
dc.title	Strain dependence electrical resistance and cohesive strength of ITO thin films deposited on electroactive polymer	por
dc.type	article	-
dc.peerreviewed	yes	por
oaire.citationStartPage	4525	por
oaire.citationEndPage	4528	por
oaire.citationIssue	16	por
oaire.citationVolume	518	por
dc.date.updated	2019-09-09T10:11:22Z	-
dc.identifier.doi	10.1016/j.tsf.2009.12.022	por
dc.subject.wos	Science & Technology	-
sdum.export.identifier	5398	-
sdum.journal	Thin Solid Films	por
Aparece nas coleções:	CDF - GRF - Artigos/Papers (with refereeing)

Ficheiros deste registo:

Ficheiro	Descrição	Tamanho	Formato
TSF_518_2010_4525–4528_Strain dependence electrical resistance and cohesive strength of ITO thin films deposited on electroactive polymer.pdf		768,19 kB	Adobe PDF	Ver/Abrir

Ver registo simples Sugerir correção Estatísticas

Citations

Altmetrics