Utilize este identificador para referenciar este registo:
https://hdl.handle.net/1822/4274
Título: | Integrated silicon microspectrometers |
Autor(es): | Kong, S. H. Correia, J. H. Bartek, M. Wolffenbuttel, R. F. |
Palavras-chave: | Microinterferometers Integrated silicon microspectrometers |
Data: | Set-2001 |
Editora: | IEEE |
Revista: | IEEE Instrumentation & Measurement Magazine |
Citação: | "IEEE Instrumentation & Measurement Magazine". ISSN 1094-6969. 4:3 (Sept. 2001) 34-38. |
Resumo(s): | Microspectrometers, which read color and the results from analytical chemistry, are used for quality inspection in industry and agiculture. They read the chromatography results by measuring the infrared (IR) absorption of the chemical constituent between the IR source and the grating. Micromachining can implement the dispersion and detection elements in a silicon microspectrometer so that it can analyze the spectrum of incident light. The microspectrometer may either operate an array of detectors, each with a uniform spectral response, or scan the dispersion element using a single calibrated detector. Compared to bulky macroscopic devices, this microspectrometer has inferior spectral resolution but its small size and low cost more than compensates for this limitation in many applications. |
Tipo: | Artigo |
URI: | https://hdl.handle.net/1822/4274 |
ISSN: | 1094-6969 |
Arbitragem científica: | yes |
Acesso: | Acesso aberto |
Aparece nas coleções: | DEI - Artigos em revistas internacionais |
Ficheiros deste registo:
Ficheiro | Descrição | Tamanho | Formato | |
---|---|---|---|---|
I&M_Magaz.pdf | Documento principal | 3,08 MB | Adobe PDF | Ver/Abrir |