Please use this identifier to cite or link to this item: https://hdl.handle.net/1822/38302

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dc.contributor.authorCortez, Paulopor
dc.contributor.authorSantos, Manuel Filipepor
dc.date.accessioned2015-11-19T12:47:23Z-
dc.date.available2015-11-19T12:47:23Z-
dc.date.issued2015-06-
dc.identifier.citationCortez, P., & Santos, M. F. (2015). Recent advances on knowledge discovery and business intelligence. Expert Systems, 32(3), 433-434. doi: 10.1111/exsy.12087por
dc.identifier.issn0266-4720-
dc.identifier.urihttps://hdl.handle.net/1822/38302-
dc.descriptionSpecial issue guest editorial, June, 2015.por
dc.description.abstract[Excerpt] Introduction: Information Technology (IT) is advancing rapidly. In the last years, IT costs have reduced while data storage, communication and processing capabilities have increased. In effect, vast datasets are becoming commonplace. All this data hold valuable knowledge such as trends and patterns, which can be used to improve decision making and optimize chances of success. These datasets are often highly complex for a manual analysis due to the volume, variety and velocity properties of data. (...)por
dc.description.sponsorshipThis work was supported by FCT within the Project Scope: PEst-OE/EEI/UI0319/2014.por
dc.language.isoengpor
dc.publisherWileypor
dc.relationinfo:eu-repo/grantAgreement/FCT/5876/135968/PT-
dc.rightsopenAccesspor
dc.subjectKnowledge Discoverypor
dc.subjectBusiness Intelligencepor
dc.title[An editorial to] Recent Advances on Knowledge Discovery and Business Intelligencepor
dc.typejournalEditorialpor
dc.peerreviewedyespor
dc.relation.publisherversionThe original publication is available at http://onlinelibrary.wiley.com/doi/10.1111/exsy.12087/abstractpor
sdum.publicationstatuspublishedpor
oaire.citationStartPage433por
oaire.citationEndPage434por
oaire.citationIssue3por
oaire.citationTitleExpert Systemspor
oaire.citationVolume32por
dc.identifier.doi10.1111/exsy.12087por
dc.subject.fosEngenharia e Tecnologia::Engenharia Eletrotécnica, Eletrónica e Informáticapor
dc.subject.wosScience & Technologypor
sdum.journalExpert Systemspor
Appears in Collections:CAlg - Artigos em revistas internacionais / Papers in international journals

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