Utilize este identificador para referenciar este registo:
https://hdl.handle.net/1822/13773Registo completo
| Campo DC | Valor | Idioma |
|---|---|---|
| dc.contributor.author | Cerqueira, M. F. | - |
| dc.contributor.author | Losurdo, M. | - |
| dc.contributor.author | Stepikhova, M. | - |
| dc.contributor.author | Alpuim, P. | - |
| dc.contributor.author | Andrês, G. | - |
| dc.contributor.author | Kozanecki, A. | - |
| dc.contributor.author | Soares, Manuel Jorge | - |
| dc.contributor.author | Peres, M. | - |
| dc.date.accessioned | 2011-10-04T17:12:24Z | - |
| dc.date.available | 2011-10-04T17:12:24Z | - |
| dc.date.issued | 2009 | - |
| dc.identifier.issn | 0040-6090 | por |
| dc.identifier.uri | https://hdl.handle.net/1822/13773 | - |
| dc.description.abstract | Erbium doped nanocrystalline silicon (nc-Si:Er) thin films were produced by reactive magnetron rf sputtering and by Er ion implantation into chemical vapor deposited Si films. The structure and chemical composition of films obtained by the two approaches were studied by micro-Raman scattering, spectroscopic ellipsometry and Rutherford backscattering techniques. Variation of deposition parameters was used to deposit films with different crystalline fraction and crystallite size. Photoluminescence measurements revealed a correlation between film microstructure and the Er3+ photoluminescence efficiency. | por |
| dc.description.sponsorship | FCT Project POCTI/CTM/39395/2001 | por |
| dc.description.sponsorship | INTAS Project #03-51-6486 | por |
| dc.language.iso | eng | por |
| dc.publisher | Elsevier 1 | por |
| dc.relation | info:eu-repo/grantAgreement/FCT/POCI/39395/PT | - |
| dc.rights | openAccess | por |
| dc.subject | Erbium | por |
| dc.subject | Nanocrystalline silicon | por |
| dc.subject | Photoluminescence | por |
| dc.title | Photoluminescence of nc-Si:Er thin films obtained by physical and chemical vapour deposition techniques: The effects os microstructure and chemical composition | por |
| dc.type | article | por |
| dc.peerreviewed | yes | por |
| dc.relation.publisherversion | http://www.sciencedirect.com/science/article/pii/S0040609009004441 | por |
| sdum.publicationstatus | published | por |
| oaire.citationStartPage | 5808 | por |
| oaire.citationEndPage | 5812 | por |
| oaire.citationIssue | 20 | por |
| oaire.citationTitle | Thin Solid Films | por |
| oaire.citationVolume | 517 | por |
| dc.identifier.doi | 10.1016/j.tsf.2009.02.146 | por |
| dc.subject.wos | Science & Technology | por |
| sdum.journal | Thin Solid Films | por |
| Aparece nas coleções: | CDF - CEP - Artigos/Papers (with refereeing) | |
Ficheiros deste registo:
| Ficheiro | Descrição | Tamanho | Formato | |
|---|---|---|---|---|
| PL-SiEr-TSF2009.pdf | Documento principal | 270,77 kB | Adobe PDF | Ver/Abrir |
