Utilize este identificador para referenciar este registo: https://hdl.handle.net/1822/12253

TítuloCohesive strength of nanocrystalline ZnO: Ga thin films deposited at room temperature
Autor(es)Samantilleke, A. P.
Rebouta, L.
Garim, V.
Rubio-Peña, L.
Lanceros-Méndez, S.
Alpuim, P.
Carvalho, S.
Kudrin, A. V.
Danilov, Yu. A.
Palavras-chaveTensile test
GZO
Cohesive strength
Crack onset strain
Data2011
EditoraSpringer
RevistaNanoscale Research Letters
Citação"Nanoscale Research Letters." ISSN 1556-276X. 6 (Abr. 2011)
Resumo(s)Transparent conducting nanocrystalline ZnO:Ga (GZO) films with electromechanical and electro-optical properties were deposited by dc magnetron sputtering at room temperature on polymers (and glass for comparison). Electrical resistivity of 8.8x10-4 and 2.2x10-3 Ω.cm was obtained for films deposited on glass and polymers respectively. The crack onset strain (COS), the cohesive strength of the coatings, as well as the influence of mechanical strain on the electrical properties were all investigated through tensile testing. The COS is similar for different GZO coatings and occurs for nominal strains ~1%. The cohesive strength of coatings, which was evaluated from the initial part of the crack density evolution, was found to be between 1.3 and 1.4 GPa. For these calculations, a Young´s modulus of 112 GPa was used, evaluated by nanoindentation.
TipoArtigo
URIhttps://hdl.handle.net/1822/12253
DOI10.1186/1556-276X-6-309
ISSN1556-276X
Versão da editorahttp://www.nanoscalereslett.com/
Arbitragem científicayes
AcessoAcesso restrito UMinho
Aparece nas coleções:CDF - FCD - Artigos/Papers (with refereeing)

Ficheiros deste registo:
Ficheiro Descrição TamanhoFormato 
NRL_A.pdf
Acesso restrito!
243,29 kBAdobe PDFVer/Abrir

Partilhe no FacebookPartilhe no TwitterPartilhe no DeliciousPartilhe no LinkedInPartilhe no DiggAdicionar ao Google BookmarksPartilhe no MySpacePartilhe no Orkut
Exporte no formato BibTex mendeley Exporte no formato Endnote Adicione ao seu ORCID