Data | Título | Autor(es) | Tipo | Acesso |
Nov-2018 | Combined in-depth X-ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectroscopy study of the effect of deposition pressure and substrate bias on the electrical properties and composition of Ga-doped ZnO thin films grown by magnetron sputtering | Correia, Filipe Costa; Ribeiro, Joana Margarida Fernandes Silva; Salvador, Paulo Miguel Babo Cunha, et al. | Artigo | Acesso restrito UMinho |
Mar-2019 | Compositional analysis by RBS, XPS and EDX of ZnO:Al,Bi and ZnO:Ga,Bi thin films deposited by d.c. magnetron sputtering | Ribeiro, J. M.; Correia, Filipe Costa; Salvador, Paulo Miguel Babo Cunha, et al. | Artigo | Acesso restrito UMinho |
Out-2020 | Corrigendum to “Compositional analysis by RBS, XPS and EDX of ZnO:Al,Bi and ZnO:Ga,Bi thin films deposited by d.c. magnetron sputtering” [Vacuum 161 (2019) 268–275] | Ribeiro, J. M.; Correia, Filipe Costa; Salvador, Paulo Miguel Babo Cunha, et al. | Corrigenda | Acesso restrito UMinho |
Jun-2018 | Effect on the electrical and morphological properties of Bi incorporation into ZnO:Ga and ZnO:Al thin films deposited by confocal magnetron sputtering | Correia, Filipe Costa; Salvador, Paulo Miguel Babo Cunha; Ribeiro, J. M., et al. | Artigo | Acesso restrito UMinho |