Utilize este identificador para referenciar este registo:
https://hdl.handle.net/1822/86988
Registo completo
Campo DC | Valor | Idioma |
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dc.contributor.author | Magalhaes, S. | por |
dc.contributor.author | Dias, M. | por |
dc.contributor.author | Nunes, B. | por |
dc.contributor.author | Oliveira, F. | por |
dc.contributor.author | Cerqueira, M. F. | por |
dc.contributor.author | Alves, E. | por |
dc.date.accessioned | 2023-10-19T10:39:53Z | - |
dc.date.issued | 2022-07-21 | - |
dc.identifier.citation | Magalhães, S., Dias, M., Nunes, B., Oliveira, F., Cerqueira, M. F., & Alves, E. (2022, May 3). Confronting Vegard’s rule in Ge1−x Sn x epilayers: from fundamentals to the effect of defects. Journal of Physics D: Applied Physics. IOP Publishing. http://doi.org/10.1088/1361-6463/ac677a | por |
dc.identifier.issn | 0022-3727 | por |
dc.identifier.uri | https://hdl.handle.net/1822/86988 | - |
dc.description.abstract | Comprehensive and systematic study challenging the application of Vegard's rule to germanium tin solid solutions grown on germanium buffer layers and 100 silicon substrates is presented. The binary's lattice parameters, composition and respective uncertainties are determined through x-ray diffraction via reciprocal space mapping technique employing newly developed software. The tin content is confirmed by Rutherford backscattering spectrometry and energy dispersive x-ray spectroscopy. The statistical agreement between the tin contents derived by the different structural characterization techniques suggests the binary to follow generically the Vegard's rule in the range of low Sn molar fractions (<5%). Phase separation, Sn segregation, point defects, post-growing oxygen impurities, and deteriorated surface morphology are found to be relevant within the similar to 200 nm germanium tin films. Although, complex mechanisms triggering composition/strain heterogeneities are found in the analysed Ge1-x Sn (x) compounds, the deviation from the perfect crystals is suggested to be not enough to distort the in- and out-of-plane lattice parameters away from its empirical linear combination. | por |
dc.description.sponsorship | This work was supported by the Portuguese Foundation for Science and Technology (FCT) in the framework of the Plurianual Strategic Funding UID/FIS/50010/2019. F O acknowledges the FCT PhD Grant and thanks the Institut fur Halbleitertechnik, Universitat Stuttgart for hospitality. The authors acknowledge Professor J Schulze for providing the MBE facilities and the growing of the growing of the germanium tin films. | por |
dc.language.iso | eng | por |
dc.publisher | IOP Publishing Ltd | por |
dc.relation | info:eu-repo/grantAgreement/FCT/6817 - DCRRNI ID/UID%2FFIS%2F50010%2F2019/PT | por |
dc.rights | openAccess | por |
dc.rights.uri | http://creativecommons.org/licenses/by/4.0/ | por |
dc.subject | GeSn compound | por |
dc.subject | x-ray diffraction | por |
dc.subject | x-ray reflectivity | por |
dc.subject | defects | por |
dc.subject | ion channelling | por |
dc.title | Confronting Vegard's rule in Ge1-x Sn (x) epilayers: from fundamentals to the effect of defects | por |
dc.type | article | - |
dc.peerreviewed | yes | por |
dc.relation.publisherversion | https://iopscience.iop.org/article/10.1088/1361-6463/ac677a | por |
oaire.citationIssue | 29 | por |
oaire.citationVolume | 55 | por |
dc.date.updated | 2023-10-19T10:26:07Z | - |
dc.identifier.eissn | 1361-6463 | por |
dc.identifier.doi | 10.1088/1361-6463/ac677a | por |
dc.date.embargo | 10000-01-01 | - |
dc.subject.fos | Ciências Naturais::Ciências Físicas | por |
dc.subject.wos | Science & Technology | - |
sdum.export.identifier | 12832 | - |
sdum.journal | Journal of Physics D: Applied Physics | por |
oaire.version | VoR | por |
Aparece nas coleções: | PHYSICS OF QUANTUM MATERIALS AND BIONANOSTRUCTURES (2018 - ...) |
Ficheiros deste registo:
Ficheiro | Descrição | Tamanho | Formato | |
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Magalhaes_2022_J._Phys._D _Appl._Phys._55_295301.pdf | 7,03 MB | Adobe PDF | Ver/Abrir |
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