Data | Título | Autor(es) | Tipo | Acesso |
2010 | Crystal size and crystalline volume fraction effects on the Erbium emission of nc-Si:Er grown by r.f. sputtering | Cerqueira, M. F.; Stepikhova, M.; Kozanecki, A., et al. | Artigo | Acesso aberto |
30-Jan-2004 | Effect of substrate bias voltage on amorphous Si–C–N films produced by PVD techniques | Cunha, L.; Moura, C.; Leme, J., et al. | Artigo | Acesso aberto |
2009 | Photoluminescence of nc-Si:Er thin films obtained by physical and chemical vapour deposition techniques: The effects os microstructure and chemical composition | Cerqueira, M. F.; Losurdo, M.; Stepikhova, M., et al. | Artigo | Acesso aberto |
2009 | Structural and photoluminescence studies of erbium implanted nanocrystalline silicon thin films | Cerqueira, M. F.; Alpuim, P.; Filonovich, Sergej, et al. | Artigo | Acesso aberto |