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Item hits: Results 1-10 of 39 (Search time: 0.0 seconds).
Issue DateTitleAuthor(s)TypeAccess
2009Structural and photoluminescence studies of erbium implanted nanocrystalline silicon thin filmsCerqueira, M. F.; Alpuim, P.; Filonovich, Sergej; Alves, E.; Rolo, Anabela G.; Andrês, G.; Soares, J.; Kozanecki, A.ArticleOpen access
2006Microstrucure and thermal features a-Si:H and nc-Si:H thin films produced by r.f. sputteringThaiyalnayaki, V.; Cerqueira, M. F.; Macedo, Francisco; Ferreira, J. A.Conference paperOpen access
2003Influence of crystals distribution on the photoluminescence properties of nanocrystalline silicon thin filmsCerqueira, M. F.; Stepikhova, M.; Losurdo, M.; Giangregorio, M. M.; Alves, E.; Monteiro, T.; Soares, Manuel J.; Boemare, C.ArticleOpen access
3-Aug-2013The effect of argon plasma treatment on the permeation barrier properties of silicon nitride layersMajee, Subimal; Cerqueira, M. F.; Tondelier, D.; Geffroy, B.; Bonnassieux, Y.; Alpuim, P.; Bourée, J. E.ArticleOpen access
17-Apr-2013Study on excimer laser irradiation for controlled dehydrogenation and crystallization of boron doped hydrogenated amorphous/nanocrystalline silicon multilayersGontad, F.; Filonovich, Sergej; Cerqueira, M. F.; Alpuim, P.; Chiussi, StefanoArticleOpen access
2010Crystal size and crystalline volume fraction effects on the Erbium emission of nc-Si:Er grown by r.f. sputteringCerqueira, M. F.; Stepikhova, M.; Kozanecki, A.; Andrês, G.; Alves, E.ArticleOpen access
2010Effect of grain size and hydrogen passivation on the electrical properties of nanocrystalline silicon filmsCerqueira, M. F.; Semikina, T. V.; Baidus, N. V.; Alves, E.ArticleOpen access
2003Laser modulated optical reflectance of thin semiconductor films on glassFotsing, J. L. N.; Hoffmeyer, M.; Chotikaprakhan, S.; Dietzel, D.; Pelzl, J.; Bein, Bruno K.; Cerqueira, M. F.; Macedo, Francisco; Ferreira, J. A.ArticleOpen access
21-Jan-2011High-rate deposition of nano-crystalline silicon thin films on plasticsMarins, Emílio Sérgio; Guduru, Virendra; Ribeiro, Miguel; Cerqueira, M. F.; Bouattour, Ali; Alpuim, P.Conference paperOpen access
Apr-2010Erbium-doped nanocrystalline silicon thin films produced by RF sputtering: annealing effect on the ER emissionCerqueira, M. F.; Monteiro, T.; Soares, Manuel Jorge; Kozanecki, A.; Alpuim, P.; Alves, E.Conference paperOpen access