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TitleDielectric function of nanocrystalline silicon with few nanometers (<3 nm) grain size
Author(s)Losurdo, M.
Giangregorio, M. M.
Capezzuto, Pio
Bruno, G.
Cerqueira, M. F.
Alves, E.
Stepikhova, M.
KeywordsDielectric function
Nanocrystalline silicon
Issue date2003
PublisherAIP Publishing
JournalApplied Physics Letters
Abstract(s)The dielectric function of nanocrystalline silicon (nc-Si) with crystallite size in the range of 1 to 3 nm has been determined by spectroscopic ellipsometry in the range of 1.5 to 5.5 eV. ATauc–Lorentz parameterization is used to model the nc-Si optical properties. The nc-Si dielectric function can be used to analyze nondestructively nc-Si thin films where nanocrystallites cannot be detected by x-ray diffraction and Raman spectroscopy.
Publisher version
AccessOpen access
Appears in Collections:CDF - FMNC - Artigos/Papers (with refereeing)

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