Utilize este identificador para referenciar este registo:
https://hdl.handle.net/1822/13915| Título: | Laser modulated optical reflectance of thin semiconductor films on glass |
| Autor(es): | Fotsing, J. L. N. Hoffmeyer, M. Chotikaprakhan, S. Dietzel, D. Pelzl, J. Bein, Bruno K. Cerqueira, M. F. Macedo, Francisco Ferreira, J. A. |
| Palavras-chave: | Laser-modulated optical reflectance Transport properties Thin films |
| Data: | 2003 |
| Editora: | AIP Publishing |
| Revista: | Review of Scientific Instruments |
| Resumo(s): | Semiconductor films, deposited by reactive magnetron sputtering on glass substrates have been analyzed with the help of laser-modulated optical reflectance. The results are discussed with respect to the thermal and charge carrier transport properties. Semiconductor properties have been identified both for micro-crystalline and amorphous films |
| Tipo: | Artigo |
| URI: | https://hdl.handle.net/1822/13915 |
| DOI: | 10.1063/1.1523139 |
| ISSN: | 0034-6748 |
| Versão da editora: | http://adsabs.harvard.edu/abs/2003RScI...74..873F |
| Arbitragem científica: | yes |
| Acesso: | Acesso aberto |
| Aparece nas coleções: | CDF - CEP - Artigos/Papers (with refereeing) CDF - FMNC - Artigos/Papers (with refereeing) |
Ficheiros deste registo:
| Ficheiro | Descrição | Tamanho | Formato | |
|---|---|---|---|---|
| LMOR-Si-RSI2003.pdf | Documento principal | 234,52 kB | Adobe PDF | Ver/Abrir |
