Utilize este identificador para referenciar este registo: https://hdl.handle.net/1822/6290

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dc.contributor.authorSobral, João Luís Ferreira-
dc.date.accessioned2007-04-13T17:11:14Z-
dc.date.available2007-04-13T17:11:14Z-
dc.date.issued2005-
dc.identifier.citation"Lecture notes in computer science". ISSN 0302-9743. 3523 (Jan 2005) 682 -688.eng
dc.identifier.isbn3540261540por
dc.identifier.issn0302-9743-
dc.identifier.urihttps://hdl.handle.net/1822/6290-
dc.description.abstractThis paper presents a new methodology to detect leather defects, based on the wavelet transform. The methodology uses a bank of optimised filters, where each filter is tuned to one defect type. Filter shape and wavelet sub-band are selected based the maximisation of the ratio between features values on defect regions and on normal regions. The proposed methodology can detect defects even when small features variations are present, which are not detect by generic texture classification techniques, and is fast enough to be used for real-time leather inspection.eng
dc.description.sponsorship(undefined)por
dc.language.isoengeng
dc.publisherSpringer Verlagpor
dc.rightsopenAccesseng
dc.subjectGraphicseng
dc.subjectInteraction and visioneng
dc.titleLeather inspection based on waveletseng
dc.typeconferencePapereng
oaire.citationStartPage682por
oaire.citationEndPage688por
oaire.citationIssueIIpor
oaire.citationVolume3523por
dc.subject.wosScience & Technologypor
sdum.journalLecture Notes in Computer Sciencepor
sdum.conferencePublicationPATTERN RECOGNITION AND IMAGE ANALYSIS, PT 2, PROCEEDINGSpor
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