Please use this identifier to cite or link to this item: http://hdl.handle.net/1822/61340

TitleStrain dependence electrical resistance and cohesive strength of ITO thin films deposited on electroactive polymer
Author(s)Rebouta, L.
Rubio-Peña, L.
Oliveira, C.
Lanceros-Méndez, S.
Tavares, C. J.
Alves, E.
KeywordsTensile test
ITO
Cohesive strength
Crack onset strain
Electroactive polymers
Issue date1-Jun-2010
PublisherElsevier Science SA
JournalThin Solid Films
Abstract(s)Transparent, conducting, indium tin oxide (ITO) films have been deposited, by pulsed dc magnetron sputtering, on glass and electroactive polymer (poly(vinylidene fluoride)-PVDF) substrates. Samples have been prepared at room temperature by varying the oxygen partial pressure. Electrical resistivity around 8.4 x 10(-4) Omega cm has been obtained for films deposited on glass, while a resistivity of 1.7 x 10(-3) Omega cm has been attained in similar coatings on PVDF. Fragmentation tests were performed on PVDF substrates with thicknesses of 28 mu m and 110 mu m coated with 40 nm ITO layer. The coating's fragmentation process was analyzed and the crack onset strain and cohesive strength of ITO layers were evaluated.
TypeArticle
URIhttp://hdl.handle.net/1822/61340
DOI10.1016/j.tsf.2009.12.022
ISSN0040-6090
Peer-Reviewedyes
AccessOpen access
Appears in Collections:CDF - GRF - Artigos/Papers (with refereeing)


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