Please use this identifier to cite or link to this item: http://hdl.handle.net/1822/5768

TitleTechniques for unveiling faults during knitting production
Author(s)Catarino, André P.
Rocha, A. M.
Monteiro, João L.
Soares, Filomena
KeywordsMonitoring
Fault detection
Knitting machines
Signal processing
Pattern detection
knitting machine
Average Magnitude Cross-Difference
Issue dateMay-2004
PublisherIEEE
CitationIEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS (ISIE), CORSICA, FRANCE, 2004 – “ISIE 2004 : proceedings of the IEEE International Symposium on Industrial Electronics, France, 2004”. [S.l.] : IEEE, 2004. p. 389-394.
Abstract(s)Detection of faults during production of knitted fabric is crucial for improved quality and productivity. The yarn input tension is an important parameter that can be used for this purpose. This paper will present and discuss a computer-based monitoring system which was developed for the detection of faults and malfunctions during the production of weft knitted fabric, using the yarn input tension. In particular, it will present the method used to unveil the appearance of faults, based on two different approaches: comparison with a previously acquired waveform and a particular pattern matching technique - Average Magnitude Cross-Difference.
TypeConference paper
URIhttp://hdl.handle.net/1822/5768
ISBN0780383044
DOI10.1109/ISIE.2004.1571839
Publisher version'The original publication is available at www.ieee.com'
Peer-Reviewedyes
AccessOpen access
Appears in Collections:CAlg - Artigos em livros de atas/Papers in proceedings
DEI - Artigos em atas de congressos internacionais
DET/2C2T - Comunicações em congressos internacionais com arbitragem científica

Files in This Item:
File Description SizeFormat 
SF-003520-ISIE2004.pdfDocumento Principal428,79 kBAdobe PDFView/Open

Partilhe no FacebookPartilhe no TwitterPartilhe no DeliciousPartilhe no LinkedInPartilhe no DiggAdicionar ao Google BookmarksPartilhe no MySpacePartilhe no Orkut
Exporte no formato BibTex mendeley Exporte no formato Endnote Adicione ao seu ORCID