Please use this identifier to cite or link to this item: http://hdl.handle.net/1822/37421

TitlePattern-based ETL conceptual modelling
Author(s)Oliveira, Bruno
Santos, Vasco
Belo, O.
KeywordsData Warehousing System
ETL Systems
ETL Conceptual Modelling
Verification and validation
ETL patterns and meta-models
BPMN
Verification
and Validation
and BPMN
ETL patterns
Meta-models
Validation
Issue date2013
PublisherSpringer
JournalLecture Notes in Computer Science
Abstract(s)In software development, patterns and standards are two important things that contribute strongly to the success of any system implementation. Characteristics like these ones improve a lot systems communication and data interchange across different computational platforms, integrating processes and data flows in an easy way. In ETL systems, the change of business requirements is a very serious problem leading frequently to reengineer existing populating processes implementations in order to receive new data structures or tasks not defined previously. Every time this happens, existing ETL processes must be changed in order to accommodate new business requirements. Furthermore, ETL modelling and planning suffers from a lack of mature methodology and notation to represent ETL processes in a uniform way across all implementation process, providing means to validate, reduce implementation errors, and improve communication among users with different knowledge in the field. In this paper, we used the BPMN modelling language for ETL conceptual modelling, providing formal specifications for workflow orchestration and data process transformations. We provide a new layer of abstraction that is based on a set of patterns expressed in BPMN for ETL conceptual modelling. These patterns or meta-models represent the most common used tasks in real world ETL systems.
TypeConference paper
DescriptionPublicado em "Model and data engineering". Volume 8216 of the series Lecture notes in computer science
URIhttp://hdl.handle.net/1822/37421
ISBN978-3-642-41365-0
DOI10.1007/978-3-642-41366-7_20
ISSN978-3-642-41366-7
Peer-Reviewedyes
AccessRestricted access (UMinho)
Appears in Collections:CAlg - Artigos em livros de atas/Papers in proceedings

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