Please use this identifier to cite or link to this item: http://hdl.handle.net/1822/3521

TitleChain reorientation in ß-PVDF films upon transverse mechanical deformation studied by SEM and dielectric relaxation
Author(s)Barbosa, R.
Mendes, J. A.
Sencadas, Vítor João Gomes Silva
Mano, J. F.
Lanceros-Méndez, S.
KeywordsPVDF
SEM
Dielectric relaxation
Mechanical deformation
Issue date2003
PublisherTaylor and Francis
JournalFerroelectrics
Citation"Ferroelectrics". ISSN 0015-0193. 294 (2003) 78-83.
Abstract(s)Chain reorientation may be induced in polyvinylidene fluoride (PVDF) in its ß-phase by applying a deformation perpendicular to the pre-oriented polymeric chains. This reorientation begins right after the yielding point and seems to be completed when the stress-strain curve stabilizes. We have studied the chain reorientation mechanism by scanning electron microscopy (SEM) and dielectric relaxation methods and we have analyzed its influence in the alpha- and ß-relaxations of the polymer. SEM images confirm the existence of a reorientation upon transversal deformation. The decrease of crystallinity with increasing reorientation and the dependence of the dielectric permittivity upon deformation indicate that a model of stress-induced melting followed by an incomplete recrystallization properly describes the reorientation mechanism.
TypeConference paper
URIhttp://hdl.handle.net/1822/3521
DOI10.1080/00150190390238630
ISSN0015-0193
Publisher versionhttp://www.tandf.co.uk/journals/online/0015-0193.asp
Peer-Reviewedyes
AccessOpen access
Appears in Collections:CDF - FCD - Artigos/Papers (with refereeing)

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