Please use this identifier to cite or link to this item: http://hdl.handle.net/1822/27450

TitleMulti-dimensional modelling of electrostatic forces between atomic force microscopy tip and dielectric surface
Author(s)Boularas, A.
Baudouin, F.
Teyssedre, Gilles
Villeneuve-Faure, C.
Clain, Stéphane
KeywordsDielectric
Modeling
Finite volume
Microscopy
AFM
electrostatic force
finite volume method (FVM)
Polynomial reconstruction operator (PRO)
dielectric material
Issue date2013
PublisherIEEE
JournalIeee International Conference on Solid Dielectrics-Icsd
Abstract(s)In this paper, simulation results for the electrostatic force between an Atomic Force Microscope (AFM) sensor and the surface of a dielectric are presented for different bias voltages on the tip:. The aim is to analyse force-distance curves as AFM detection mode for electrostatic charges. The sensor is composed of a cantilever supporting a conical tip terminated by a spherical apex; the effect of the cantilever is neglected here. Our model of force curve has been developed using the Finite Volume Method. The scheme is based on the Polynomial Reconstruction Operator – PRO-scheme. First results of the computation of electrostatic force for different tip– sample distances, 0 to 600 nm, and for different DC voltage stress applied to the tip, 6 to 25 V, are shown and compared with experimental data in order to validate our approach.
TypeConference paper
URIhttp://hdl.handle.net/1822/27450
ISBN9781479908073
DOI10.1109/ICSD.2013.6619876
ISSN1553-5282
Publisher versionhttp://ieeexplore.ieee.org/Xplore/home.jsp
Peer-Reviewedyes
AccessRestricted access (UMinho)
Appears in Collections:CMAT - Artigos em atas de conferências e capítulos de livros com arbitragem / Papers in proceedings of conferences and book chapters with peer review

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