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Issue DateTitleAuthor(s)TypeAccess
2012Structural and electrical studies of ultrathin layers with Si0.7Ge0.3 nanocrystals confined in a SiGe/SiO2 superlatticeVieira, E. M. F.; Martín-Sánchez, J.; Rolo, Anabela G.; Parisini, Andrea; Buljan, Maja; Capan, I.; Alves, Eduardo; Barradas, Nuno P.; Conde, Olinda; Bernstorff, Sigrid; Chahboun, A.; Levichev, S.; Gomes, M. J. M.ArticleRestricted access (UMinho)
2010Effect of grain size and hydrogen passivation on the electrical properties of nanocrystalline silicon filmsCerqueira, M. F.; Semikina, T. V.; Baidus, N. V.; Alves, E.ArticleOpen access
24-Jul-2017SiGe layer thickness effect on the structural and optical properties of well-organized SiGe/SiO2 multilayersVieira, E. M. F.; Toudert, J.; Rolo, Anabela G.; Parisini, A.; Leitão, J. P.; Correia, M. R.; Franco, N.; Alves, E.; Chahboun, Adil; Martín-Sánchez, J.; Serna, R.; Gomes, M. J. M.ArticleRestricted access (UMinho)
2002Confined optical vibrations in CdTe quantum dots and clustersRolo, Anabela G.; Vasilevskiy, Mikhail; Gaponik, Nikolai; Talapin, Dmitrii; Rogach, Andrey; Gomes, M. J. M.ArticleOpen access
Sep-2015Raman study of insulating and conductive ZnO: (Al, Mn) thin filmsCerqueira, M. F.; Viseu, T. M. R.; Campos, J. Ayres de; Rolo, Anabela G.; Lacerda-Arôso, T. de; Oliveira, F.; Bogdanovic-Radovic, I.; Alves, E.; Vasilevskiy, MikhailArticleOpen access
2011Resonant raman scattering in ZnO : Mn and ZnO: Mn : Al thin films grown by RF sputteringCerqueira, M. F.; Vasilevskiy, Mikhail; Oliveira, Fernando; Rolo, Anabela G.; Viseu, T. M. R.; Campos, J. Ayres de; Alves, E.; Correia, RosárioArticleOpen access
1998Structural properties of Ge nano-crystals embedded in SiO2 films from X-ray diffraction and Raman spectroscopyRolo, Anabela G.; Vasilevskiy, Mikhail; Conde, O.; Gomes, M. J. M.ArticleRestricted access (UMinho)
1997One-phonon Raman scattering from arrays of semiconductor nano-crystalsVasilevskiy, Mikhail; Rolo, Anabela G.; Gomes, M. J. M.ArticleOpen access
2017Raman and IR-ATR spectroscopy studies of heteroepitaxial structures with a GaN:C top layerCerqueira, M. F.; Vieira, L. G.; Alves, A.; Correia, R.; Huber, M.; Andreev, A.; Bonanni, A.; Vasilevskiy, MikhailArticleOpen access
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