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Issue DateTitleAuthor(s)TypeAccess
2013Influence of stoichiometry and structure on the optical properties of AlNxOy filmsBorges, Joel Nuno Pinto; Barradas, N. P.; Alves, Eduardo; Beaufort, Marie France; Eyidi, Dominique; Vaz, F.; Marques, L.ArticleOpen access
2011Preparation and characterization of CrNxOy thin films: The effect of composition and structural features on the electrical behaviorArvinte, R.; Borges, Joel Nuno Pinto; Sousa, R. E.; Munteanu, Florentina-Daniela; Barradas, N. P.; Alves, E.; Vaz, F.; Marques, L.ArticleOpen access
Mar-2009Optical properties of titanium oxycarbide thin filmsMarques, L.; Pinto, H.; Fernandes, Ana C.; Banakh, O.; Vaz, F.; Ramos, Marta M. D.ArticleOpen access
Jun-2009Ab initio study of the properties of Ti1-x-ySixAlyN solid solutionMarques, L.; Carvalho, S.; Vaz, F.; Ramos, Marta M. D.; Rebouta, L.ArticleOpen access
Jun-2012Electrical properties of AlNxOy thin films prepared by reactive magnetron sputteringBorges, Joel Nuno Pinto; Martin, N.; Barradas, Nuno P.; Alves, E.; Eyidi, D.; Beaufort, Marie France; Riviere, J. P.; Vaz, F.; Marques, L.ArticleOpen access
14-Apr-2011Low-temperature fabrication of layered self organized ge clusters by RF-sputteringPinto, S. R. C.; Rolo, Anabela G.; Buljan, M.; Chahboun, A.; Bernstorff, S.; Barradas, N. P.; Alves, E.; Kashtiban, R. J.; Bangert, U.; Gomes, M. J. M.ArticleOpen access
2011Influence of the deposition parameters on the growth of SiGe nanocrystals embedded in Al2O3 matrixVieira, E. M. F.; Pinto, S. R. C.; Levichev, S.; Rolo, Anabela G.; Chahboun, A.; Buljan, M.; Barradas, N. P.; Alves, E.; Bernstorff, S.; Conde, O.; Gomes, M. J. M.ArticleRestricted access (UMinho)
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