Please use this identifier to cite or link to this item: http://hdl.handle.net/1822/18498

TitleProbing the exciton density of states in semiconductor nanocrystals using integrated photoluminiscence spectroscopy
Author(s)Filonovich, Sergej
Rakovich, Yury P.
Vasilevskiy, Mikhail
Artemyev, Mikhail V.
Talapin, Dmitrii V.
Rogach, Andrey L.
Rolo, Anabela G.
Gomes, M. J. M.
KeywordsUV/Vis spectroscopy
Nanostructure
Exciton
Absorption
Photoluminescence
Semiconductor
Nanocrystals
CdTe
CdSe
CdSe/ZnS core-shell nanocrystals
Nanostmcture
Issue date7-Jan-2002
PublisherSpringer Verlag
JournalMonatshefte für Chemie
Abstract(s)We present the results of a comparative analysis of the absorption and photoluminescence excitation (PLE) spectra vs. integrated photoluminescence (IPL) measured as a function of the excitation wavelength for a number of samples containing II–VI semiconductor nanocrystals (NCs) produced by different techniques. The structure of the absorption and PL spectra due to excitons confined in NCs and difficulties with the correct interpretation of the transmittance and PLE results are discussed. It is shown that, compared to the conventional PLE, the IPL intensity plotted against the excitation wavelength (IPLE spectra) reproduce better the structure of the absorption spectra. Therefore, IPLE spectroscopy can be successfully used for probing the quantized electron-hole (e-h) transitions in semiconductor nanocrystals.
TypeArticle
URIhttp://hdl.handle.net/1822/18498
DOI10.1007/s007060200061
ISSN0026-9247
1434-4475
Publisher versionhttp://www.springerlink.com/content/rug1addn43k395r0/
Peer-Reviewedyes
AccessRestricted access (UMinho)
Appears in Collections:CDF - CEP - Artigos/Papers (with refereeing)
CDF - FMNC - Artigos/Papers (with refereeing)

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