Utilize este identificador para referenciar este registo: https://hdl.handle.net/1822/16959

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dc.contributor.authorRolo, Anabela G.-
dc.contributor.authorChahboun, A.-
dc.contributor.authorConde, O.-
dc.contributor.authorVasilevskiy, Mikhail-
dc.contributor.authorGomes, M. J. M.-
dc.date.accessioned2012-02-09T14:28:10Z-
dc.date.available2012-02-09T14:28:10Z-
dc.date.issued2008-01-
dc.date.submitted2007-05-
dc.identifier.issn1386-9477por
dc.identifier.urihttps://hdl.handle.net/1822/16959-
dc.descriptionThe authors are grateful to Dr. L. Rebouta for the RBS studies and to Dr. G. Hungerford for his careful reading of the manuscript.por
dc.description.abstractSiO2 thin films doped with Ge nanocrystals (NCs) were grown using the RF-sputtering technique. X-ray diffraction studies revealed a diamond structure for Ge NCs. The presence of Ge NCs in the grown films was also confirmed by Raman spectroscopy. Photoluminescence spectroscopy of the samples revealed an emission band at 2.07 eV, which is tentatively attributed to defects located at the Ge-matrix interface. This was found to be quite sensitive to variations of local matrix composition, induced by the annealing process.por
dc.description.sponsorshipProject POCTI/FIS/56930/2004 financed by the Portuguese Foundation for Science and Technology (FCT)por
dc.language.isoengpor
dc.publisherElsevierpor
dc.relationEuropean Commission through a project called SEMINANO under the Contract NMP4-CT-2004-505285por
dc.rightsrestrictedAccesspor
dc.subjectGermaniumpor
dc.subjectNanocrystalspor
dc.subjectPhotoluminescencepor
dc.subjectDefectspor
dc.titleAnnealing effect on the photoluminescence of ge-doped silica filmspor
dc.typearticlepor
dc.peerreviewedyespor
dc.relation.publisherversionhttp://www.sciencedirect.com/science/article/pii/S1386947707005668por
sdum.publicationstatuspublishedpor
oaire.citationStartPage674por
oaire.citationEndPage679por
oaire.citationIssue3por
oaire.citationTitlePhysica Epor
oaire.citationVolume40por
dc.identifier.doi10.1016/j.physe.2007.09.144por
dc.subject.wosScience & Technologypor
sdum.journalPhysica Epor
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CDF - FMNC - Artigos/Papers (with refereeing)

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