Please use this identifier to cite or link to this item: http://hdl.handle.net/1822/16780

TitleSurface characterization of Ti-Si-C-ON coatings for orthopedic devices : XPS and Raman spectroscopy
Author(s)Oliveira, C.
Escobar Galindo, R.
Palacio, C.
Velasco, Sebastian Calderon
Almeida, B. G.
Henriques, Mariana
Espinosa, A.
Carvalho, S.
KeywordsSputtering
GDOES
Raman
XPS
Issue dateJan-2011
PublisherElsevier Science BV
JournalSolid State Sciences
Abstract(s)Ti–Si–C–ON films were deposited by DC reactive magnetron sputtering and their chemical properties, biofilm formation and toxicity were characterized. Based on the films composition three different growth regimes were identified on the films; (I) N/Ti = 2.11 (high atomic ratio) and low oxygen content; (II) 0.77 ≤ N/Ti ≤ 1.86 (intermediate atomic ratio) and (III) N/Ti ≤ 0.12 (low ratio) and high oxygen content. The phase composition varied from mainly TiN on regime I to TiCN on regime 2 and titanium oxides on regime III. Taking into account the results of biological characterization (biofilm formation and cytotoxicity), it was possible to conclude that samples with a high TiN content (regime I) presented more favorable biocompatibility, since it was less prone to microbial colonization and also displayed a low cytotoxicity.
TypeArticle
URIhttp://hdl.handle.net/1822/16780
DOI10.1016/j.solidstatesciences.2010.10.015
ISSN1293-2558
Other identifiers1293-2558
Peer-Reviewedyes
AccessOpen access
Appears in Collections:CEB - Publicações em Revistas/Séries Internacionais / Publications in International Journals/Series

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