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|Title:||Charging effects in CdSe nanocrystals embedded in SiO2 matrix produced by rf magnetron sputtering|
Rolo, Anabela G.
Barradas, N. P.
Horvath, Zs. J.
Gomes, M. J. M.
|Abstract(s):||Charging effects in CdSe nanocrystals embedded in SiO2 matrix fabricated by rf magnetron co-sputtering technique were electrically characterized by means of capacitance–voltage (C–V) combined with current–voltage (I–V). The presence of CdSe nanocrystals was demonstrated by X-ray diffraction technique. The average size of nanocrystals was found to be approximately 3 nm. The carriers transport in the CdSe/SiO2 structure was shown to be a combination of Fowler–Nordheim tunnelling and Poole–Frenkel mechanisms. A memory effect was demonstrated and a retention time was measured.|
|Description:||S.L. thanks FCT for the financial support through the Grant SFRH/BPD/26532/ 2006.|
|Access:||Restricted access (UMinho)|
|Appears in Collections:||CDF - FMNC - Artigos/Papers (with refereeing)|
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