Please use this identifier to cite or link to this item: http://hdl.handle.net/1822/14392

TitleEffect of trace elements on the interface reactions between two lead-free solders and copper or nickel substrates
Author(s)Soares, Delfim
Vilarinho, Cândida
Barbosa, J.
Samuel, Filipe
Trigo, Luisa
Bré, Paulo
KeywordsLead-free
Electronics
solder
interface
reaction
Issue date2007
PublisherTechnical Faculty Bor, Serbia
JournalJournal of Mining and Metallurgy
CitationD. Soares, C. Vilarinho, J. Barbosa, F.Samuel, L. Trigo, P. Bré - Effect of trace elements on the interface reactions between two lead free solders and copper or nickel substrates. Journal of Mining and Metallurgy. Vol. 43B (2) (2007), p.131-139
Abstract(s)Traditional Sn-Pb solder alloys are being replaced, because of environmental and health concerns about lead toxicity. Among some alternative alloy systems, the Sn-Zn and Sn-Cu base alloy systems have been studied and reveal promising properties. The reliability of a solder joint is affected by the solder/substrate interaction and the nature of the layers formed at the interface. The solder/substrate reactions, for Sn-Zn and Sn-Cu base solder alloys, were evaluated in what concerns the morphology and chemical composition of the interface layers. The effect of the addition of P, at low levels, on the chemical composition of the layers present at the interface was studied. The phases formed at the interface between the Cu or Ni substrate and a molten lead-free solder at 250º C, were studied for different stage times and alloy compositions. The melting temperatures, of the studied alloys, were determined by Differential Scanning Calorimetry (DSC). Identification of equilibrium phases formed at the interface layer, and the evaluation of their chemical composition were performed by Scanning Electron Microscopy (SEM/EDS). Different interface characteristics were obtained, namely for the alloys containing Zn. The obtained IML layer thickness was compared, for both types of alloy systems.
Typearticle
URIhttp://hdl.handle.net/1822/14392
DOI10.2298/JMMB0702131S
ISSN1450-5339
Peer-Reviewedyes
AccessopenAccess
Appears in Collections:CT2M - Artigos em revistas de circulação internacional com arbitragem científica

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