Please use this identifier to cite or link to this item: http://hdl.handle.net/1822/14201

Full metadata record
DC FieldValueLanguage
dc.contributor.authorVentura, P. J.-
dc.contributor.authorCerqueira, M. F.-
dc.contributor.authorCarmo, M. C.-
dc.contributor.authorFerreira, J. A.-
dc.date.accessioned2011-11-09T13:54:33Z-
dc.date.available2011-11-09T13:54:33Z-
dc.date.issued1997-
dc.identifier.issn0040-6090por
dc.identifier.urihttp://hdl.handle.net/1822/14201-
dc.description.abstractMicrocrystalline and Porous on Microcrystalline Silicon thin films were produced. The photoluminescence characteristics of Porous on Microcrystalline Silicon were studied and compared with those from Microcrystalline and Porous Silicon grown on Silicon wafers. Under steady state it is possible to excite these samples with visible light at room temperature. This excitation gives rise to a red photoluminescence band, which is similar to that of Porous Silicon excited under the same conditions. MicroRaman and transmission spectroscopy shows that the Porous Silicon layer was produced below the Microcrystalline Silicon thin film that acts as a shield for excitation and emission of radiation with wavelength smaller than 500 nm. Sample thickness, crystallite size and crystallinity are determined. The results are discussed in terms of the theoretical framework based in the fluctuating quantum wire model for Porous Silicon.por
dc.description.sponsorshipFCT-Praxis XXIpor
dc.language.isoengpor
dc.publisherElsevierpor
dc.rightsopenAccesspor
dc.subjectPhotoluminescencepor
dc.subjectPropertiespor
dc.subjectPorous siliconpor
dc.subjectMicrocrystalline siliconpor
dc.titlePhotoluminescence and structure properties from mu c-Si:H and mu c-Si:H-PS samplespor
dc.typearticlepor
dc.peerreviewedyespor
dc.relation.publisherversionhttp://www.sciencedirect.com/science/article/pii/S0040609096093376por
sdum.publicationstatuspublishedpor
oaire.citationStartPage126por
oaire.citationEndPage128por
oaire.citationIssue1-2por
oaire.citationTitleThin Solid Filmspor
oaire.citationVolume296por
dc.identifier.doi10.1016/S0040-6090(96)09337-6-
dc.subject.wosScience & Technologypor
sdum.journalThin Solid Filmspor
Appears in Collections:CDF - FMNC - Artigos/Papers (with refereeing)

Files in This Item:
File Description SizeFormat 
PL-Si-TSF1997.pdfDocumento principal253,17 kBAdobe PDFView/Open

Partilhe no FacebookPartilhe no TwitterPartilhe no DeliciousPartilhe no LinkedInPartilhe no DiggAdicionar ao Google BookmarksPartilhe no MySpacePartilhe no Orkut
Exporte no formato BibTex mendeley Exporte no formato Endnote Adicione ao seu ORCID