Please use this identifier to cite or link to this item: http://hdl.handle.net/1822/13983

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dc.contributor.authorLosurdo, M.-
dc.contributor.authorCerqueira, M. F.-
dc.contributor.authorAlves, E.-
dc.contributor.authorStepikhova, M.-
dc.contributor.authorGiangregorio, M. M.-
dc.contributor.authorBruno, G.-
dc.date.accessioned2011-10-24T13:35:20Z-
dc.date.available2011-10-24T13:35:20Z-
dc.date.issued2003-
dc.identifier.issn1386-9477por
dc.identifier.urihttp://hdl.handle.net/1822/13983-
dc.description.abstractNanocrystalline silicon thin films codoped with erbium, oxygen and hydrogen have been deposited by co-sputtering of Er and Si. Films with different crystallinity, crystallite size and oxygen content have been obtained in order to investigate the effect of the microstructure on the photoluminescence properties. The correlation between the optical properties and microstructural parameters of the films is investigated by spectroscopic ellipsometry. PL response of the discussed structures covers both the visible wavelength range (a crystallite size-dependent photoluminescence detected for 5–6 nm sized nanocrystals embedded in a SiO matrix) and near IR range at 1.54 microm (Er-related PL dominating in the films with 1–3 nm sized Si nanocrystals embedded in a-Si:H). It is demonstrated that the different PL properties can be also discriminated on the basis of ellipsometric spectra.por
dc.language.isoengpor
dc.publisherElsevierpor
dc.rightsopenAccesspor
dc.subjectnc-Sipor
dc.subjectErbium dopingpor
dc.subjectSpectroscopic ellipsometrypor
dc.subjectOptical propertiespor
dc.subjectFilmspor
dc.titleInterrelation between microstructure and optical properties of erbium-doped nanocrystalline thin filmspor
dc.typearticlepor
dc.peerreviewedyespor
dc.relation.publisherversionhttp://www.sciencedirect.com/science/article/pii/S1386947702006173por
sdum.publicationstatuspublishedpor
oaire.citationStartPage414por
oaire.citationEndPage419por
oaire.citationIssue3-4por
oaire.citationTitlePhysica Epor
oaire.citationVolume16por
dc.identifier.doi10.1016/S1386-9477(02)00617-3por
dc.subject.wosScience & Technologypor
sdum.journalPhysica Epor
Appears in Collections:CDF - FMNC - Artigos/Papers (with refereeing)

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