Utilize este identificador para referenciar este registo:
https://hdl.handle.net/1822/13970| Título: | Microstrucure and thermal features a-Si:H and nc-Si:H thin films produced by r.f. sputtering |
| Autor(es): | Thaiyalnayaki, V. Cerqueira, M. F. Macedo, Francisco Ferreira, J. A. |
| Palavras-chave: | Nanocrystalline silicon Thermal properties Structure |
| Data: | 2006 |
| Editora: | Trans Tech Publications |
| Revista: | Materials Science Forum |
| Resumo(s): | Amorphous and nanocrystalline silicon thin films have been produced by reactive r.f. sputtering and their microstructure, optical and thermal properties were evaluated. A good correlation was found between the microstructure determined by Raman spectroscopy and X-ray diffraction and the thermal transport parameters |
| Tipo: | Artigo em ata de conferência |
| URI: | https://hdl.handle.net/1822/13970 |
| ISBN: | 9780878494026 |
| ISSN: | 0255-5476 |
| Versão da editora: | http://www.scientific.net/MSF.514-516.23 |
| Arbitragem científica: | yes |
| Acesso: | Acesso aberto |
| Aparece nas coleções: | CDF - CEP - Artigos/Papers (with refereeing) CDF - FMNC - Artigos/Papers (with refereeing) |
Ficheiros deste registo:
| Ficheiro | Descrição | Tamanho | Formato | |
|---|---|---|---|---|
| TF-Si-MSF2006.pdf | Documento principal | 135,7 kB | Adobe PDF | Ver/Abrir |
