Please use this identifier to cite or link to this item: http://hdl.handle.net/1822/13956

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dc.contributor.authorCerqueira, M. F.-
dc.contributor.authorLosurdo, M.-
dc.contributor.authorMonteiro, T.-
dc.contributor.authorStepikhova, M.-
dc.contributor.authorSoares, M. J.-
dc.contributor.authorPeres, M.-
dc.contributor.authorAlves, E.-
dc.contributor.authorConde, O.-
dc.date.accessioned2011-10-21T11:22:18Z-
dc.date.available2011-10-21T11:22:18Z-
dc.date.issued2006-
dc.identifier.issn0022-3093por
dc.identifier.urihttp://hdl.handle.net/1822/13956-
dc.description.abstractWe have produced and studied erbium doped nanocrystalline silicon thin films with different oxygen and hydrogen content in order to evaluate the influence of the matrix on the Er3+ emission and on the 0.89 eV and 1.17 eV bands. Films were grown by reactive magnetron sputtering on glass substrates under several different conditions (RF power, Er content and gas mixture composition) in order to obtain different microstructures. The structural parameters and the chemical composition of the samples were obtained by X-ray in the grazing incidence geometry, Raman spectroscopy and Rutherford back scattering analysis. Using X-ray technique combined with Raman spectroscopy information on the crystalline fraction and the average crystallite size of Si nanocrystals was obtained. Dependence of the 0.89 eV and 1.17 eV peaks in Si heterogeneous matrixes on the films crystallinity and O/H ratio has been analyzedpor
dc.description.sponsorshipINTAS Project #03-51-6486por
dc.description.sponsorshipFCT Project POCTI/CTM/39395/2001por
dc.language.isoengpor
dc.publisherElsevierpor
dc.relationinfo:eu-repo/grantAgreement/FCT/POCI/39395/PT-
dc.rightsopenAccesspor
dc.subjectNanocrystalline siliconpor
dc.subjectErbium dopingpor
dc.subjectThin filmspor
dc.subjectOptical propertiespor
dc.subjectsiliconpor
dc.subjectRaman scatteringpor
dc.subjectsputteringpor
dc.subjectdefectspor
dc.subjectmicrocrystallinitypor
dc.subjectnanocrystalspor
dc.subjectluminescencepor
dc.titleStudy of the oxygen role in the photoluminescence of erbium doped nanocrystalline silicon embedded in a silicon amorphous matrixpor
dc.typearticlepor
dc.peerreviewedyespor
dc.relation.publisherversionhttp://www.sciencedirect.com/science/article/pii/S0022309306002067por
sdum.publicationstatuspublishedpor
oaire.citationStartPage1148por
oaire.citationEndPage1151por
oaire.citationIssue9-20por
oaire.citationTitleJournal of Non-Crystalline Solidspor
oaire.citationVolume352por
dc.identifier.doi10.1016/j.jnoncrysol.2005.09.045por
dc.subject.wosScience & Technologypor
sdum.journalJournal of Non-Crystalline Solidspor
Appears in Collections:CDF - CEP - Artigos/Papers (with refereeing)
CDF - FMNC - Artigos/Papers (with refereeing)

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