Please use this identifier to cite or link to this item: http://hdl.handle.net/1822/13915

TitleLaser modulated optical reflectance of thin semiconductor films on glass
Author(s)Fotsing, J. L. N.
Hoffmeyer, M.
Chotikaprakhan, S.
Dietzel, D.
Pelzl, J.
Bein, Bruno K.
Cerqueira, M. F.
Macedo, Francisco
Ferreira, J. A.
KeywordsLaser-modulated optical reflectance
Transport properties
Thin films
Issue date2003
PublisherAIP Publishing
JournalReview of Scientific Instruments
Abstract(s)Semiconductor films, deposited by reactive magnetron sputtering on glass substrates have been analyzed with the help of laser-modulated optical reflectance. The results are discussed with respect to the thermal and charge carrier transport properties. Semiconductor properties have been identified both for micro-crystalline and amorphous films
TypeArticle
URIhttp://hdl.handle.net/1822/13915
DOI10.1063/1.1523139
ISSN0034-6748
Publisher versionhttp://adsabs.harvard.edu/abs/2003RScI...74..873F
Peer-Reviewedyes
AccessOpen access
Appears in Collections:CDF - CEP - Artigos/Papers (with refereeing)
CDF - FMNC - Artigos/Papers (with refereeing)

Files in This Item:
File Description SizeFormat 
LMOR-Si-RSI2003.pdfDocumento principal234,52 kBAdobe PDFView/Open

Partilhe no FacebookPartilhe no TwitterPartilhe no DeliciousPartilhe no LinkedInPartilhe no DiggAdicionar ao Google BookmarksPartilhe no MySpacePartilhe no Orkut
Exporte no formato BibTex mendeley Exporte no formato Endnote Adicione ao seu ORCID