Utilize este identificador para referenciar este registo:
https://hdl.handle.net/1822/13911| Título: | Effect of the matrix on the 1.5 microm photoluminescence of Er-doped silicon quantum dots |
| Autor(es): | Cerqueira, M. F. Stepikhova, M. Losurdo, M. Monteiro, T. Soares, Manuel Jorge Peres, M. Neves, A. Alves, E. |
| Palavras-chave: | Silicon QD Ellipsometry Photoluminescence Structure |
| Data: | 2006 |
| Editora: | Trans Tech Publications |
| Revista: | Materials Science Forum |
| Resumo(s): | Erbium doped nanocrystalline silicon thin films were produced by reactive magnetron r.f. sputtering. Their structural and chemical properties were studied by micro-Raman, spectroscopic ellipsometry and Rutherford backscattering spectroscopy. Films with different crystalline fraction and crystallite size were deposited by changing the deposition parameters. The impact of the composition and structure of Erbium ions environment on the 1.5 microm photoluminescence is discussed. |
| Tipo: | Artigo em ata de conferência |
| URI: | https://hdl.handle.net/1822/13911 |
| ISBN: | 9780878494026 |
| ISSN: | 0255-5476 |
| Versão da editora: | http://www.scientific.net/MSF.514-516.1116 |
| Arbitragem científica: | yes |
| Acesso: | Acesso aberto |
| Aparece nas coleções: | CDF - FMNC - Artigos/Papers (with refereeing) |
Ficheiros deste registo:
| Ficheiro | Descrição | Tamanho | Formato | |
|---|---|---|---|---|
| MEPL-SiEr-MSF2006.pdf | Documento principal | 191,88 kB | Adobe PDF | Ver/Abrir |
