Please use this identifier to cite or link to this item: http://hdl.handle.net/1822/12253

TitleCohesive strength of nanocrystalline ZnO: Ga thin films deposited at room temperature
Author(s)Samantilleke, A. P.
Rebouta, L.
Garim, V.
Rubio-Peña, L.
Lanceros-Méndez, S.
Alpuim, P.
Carvalho, S.
Kudrin, A. V.
Danilov, Yu. A.
KeywordsTensile test
GZO
Cohesive strength
Crack onset strain
Issue date2011
PublisherSpringer
JournalNanoscale Research Letters
Citation"Nanoscale Research Letters." ISSN 1556-276X. 6 (Abr. 2011)
Abstract(s)Transparent conducting nanocrystalline ZnO:Ga (GZO) films with electromechanical and electro-optical properties were deposited by dc magnetron sputtering at room temperature on polymers (and glass for comparison). Electrical resistivity of 8.8x10-4 and 2.2x10-3 Ω.cm was obtained for films deposited on glass and polymers respectively. The crack onset strain (COS), the cohesive strength of the coatings, as well as the influence of mechanical strain on the electrical properties were all investigated through tensile testing. The COS is similar for different GZO coatings and occurs for nominal strains ~1%. The cohesive strength of coatings, which was evaluated from the initial part of the crack density evolution, was found to be between 1.3 and 1.4 GPa. For these calculations, a Young´s modulus of 112 GPa was used, evaluated by nanoindentation.
TypeArticle
URIhttp://hdl.handle.net/1822/12253
DOI10.1186/1556-276X-6-309
ISSN1556-276X
Publisher versionhttp://www.nanoscalereslett.com/
Peer-Reviewedyes
AccessRestricted access (UMinho)
Appears in Collections:CDF - FCD - Artigos/Papers (with refereeing)

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