Percorrer por assunto Raman scattering

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Mostrar 2-16 de um total de 16 resultados. < anterior 
DataTítuloAutor(es)TipoAcesso
1998Density of vibrational states in highly disordered systems through Raman scattering and atomic-scale simulationCarles, R.; Zwick, A.; Moura, C., et al.ArtigoAcesso aberto
9-Abr-2014Effects of alloy disorder and confinement on phonon modes and Raman scattering in SixGe1-x nanocrystals : a microscopic modelingVasin, A. S.; Vikhrova, O. V.; Vasilevskiy, MikhailArtigoAcesso aberto
Jan-1998Growth and characterisation of cadmium sulphide nanocrystals embedded in silicon dioxide filmsRolo, Anabela G.; Vieira, L. G.; Gomes, M. J. M., et al.ArtigoAcesso restrito UMinho
Abr-2001Impact of disorder on optical phonons confined in CdS nano-crystallites embedded in a SiO2 matrixVasilevskiy, Mikhail; Rolo, Anabela G.; Gomes, M. J. M., et al.ArtigoAcesso aberto
2011Influence of the deposition parameters on the growth of SiGe nanocrystals embedded in Al2O3 matrixVieira, E. M. F.; Pinto, S. R. C.; Levichev, S., et al.ArtigoAcesso restrito UMinho
2005Is polaron effect important for resonant Raman scattering in self-assembled quantum dots?Vasilevskiy, Mikhail; Miranda, R. P.Artigo em ata de conferênciaAcesso aberto
16-Jul-2012Oxygen partial pressure effect on structural and electrical behavior of pulsed laser deposited Zn0.98Co0.02O thin filmsSekkar, K. C.; Khodorov, Anatoli Anatolievich; Chabhoun, A., et al.ArtigoAcesso restrito UMinho
5-Mar-2013Phonon modes and raman scattering in SixGe1-x nanocrystals: microscopic modellingVasin, Alexander; Vikhrova, Olga; Vasilevskiy, MikhailArtigo em ata de conferênciaAcesso aberto
Abr-2004Polaron effect on Raman scattering in semiconductor quantum dotsVasilevskiy, Mikhail; Miranda, R. P.; Anda, Enrique, et al.ArtigoAcesso aberto
2010Raman study of doped-ZnO thin films grown by rf sputteringCerqueira, M. F.; Rolo, Anabela G.; Viseu, T. M. R., et al.Artigo em ata de conferênciaAcesso aberto
Set-2015Raman study of insulating and conductive ZnO: (Al, Mn) thin filmsCerqueira, M. F.; Viseu, T. M. R.; Campos, J. Ayres de, et al.ArtigoAcesso aberto
19-Mar-2018Structural and vibrational properties of SnxGe1-x: Modeling and experimentsVasin, A. S.; Oliveira, F.; Cerqueira, M. F., et al.ArtigoAcesso aberto
2000Structural studies and influence of the structure on the electrical and optical properties of microcrystalline silicon thin films produced by RF sputteringCerqueira, M. F.; Ferreira, J. A.; Adriaenssens, G. J.ArtigoAcesso aberto
2006Study of the oxygen role in the photoluminescence of erbium doped nanocrystalline silicon embedded in a silicon amorphous matrixCerqueira, M. F.; Losurdo, M.; Monteiro, T., et al.ArtigoAcesso aberto
1999Temperature dependence of the first order Raman scattering in thin films of mc-Si:HCerqueira, M. F.; Ferreira, J. A.ArtigoAcesso aberto
Mostrar 2-16 de um total de 16 resultados. < anterior