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Mostrar 3-13 de um total de 13 resultados. < anterior 
DataTítuloAutor(es)TipoAcesso
2006Effect of the matrix on the 1.5 microm photoluminescence of Er-doped silicon quantum dotsCerqueira, M. F.; Stepikhova, M.; Losurdo, M., et al.Artigo em ata de conferênciaAcesso aberto
2006Erbium-doped silicon nanocrystals grown by r.f. sputtering method: competition between oxygen and silicon to get erbiumCerqueira, M. F.; Stepikhova, M.; Losurdo, M., et al.ArtigoAcesso aberto
28-Dez-2014Evolution of the surface plasmon resonance of Au:TiO2 nanocomposite thin films with annealing temperatureBorges, Joel Nuno Pinto; Buljan, M.; Sancho-Parramon, J., et al.ArtigoAcesso restrito UMinho
2003Influence of crystals distribution on the photoluminescence properties of nanocrystalline silicon thin filmsCerqueira, M. F.; Stepikhova, M.; Losurdo, M., et al.ArtigoAcesso aberto
Nov-2020Magnesium fluoride as low-refractive index material for near-ultraviolet filters applied to optical sensorsSilva, Manuel Fernando Ribeiro; Pimenta, Sara Filomena Ribeiro; Rodrigues, José Artur Oliveira, et al.ArtigoAcesso restrito UMinho
Mar-2009Optical properties of titanium oxycarbide thin filmsMarques, L.; Pinto, H.; Fernandes, Ana C., et al.ArtigoAcesso aberto
2000Quantification of adsorbed human serum albumin: A comparison between radioimmunoassay and simple null ellipsometryBenesch, Johan; Askendal, A.; Tengvall, P.ArtigoAcesso aberto
2024Silicon nitride thin-films deposited by radiofrequency reactive sputtering: refractive index optimization with substrate cooling in a nitrogen-rich atmosphereFreitas, João Rui Martins; Pimenta, Sara Filomena Ribeiro; Rodrigues, Vítor H., et al.ArtigoAcesso aberto
8-Mar-2023Surface atomic arrangement of aluminum ultra-thin layers grown on Si(111)Jum’h, Inshad; Abu-Safe, Husam H.; Ware, Morgan E., et al.ArtigoAcesso aberto
2004The role of microstructure in luminescent properties of Er-doped nanocrystalline Si thin filmsStepikhova, M.; Cerqueira, M. F.; Losurdo, M., et al.ArtigoAcesso aberto
2002The structure and photoluminescence of erbium-doped nanocrystalline silicon thin films produced by reactive magnetron sputteringCerqueira, M. F.; Losurdo, M.; Stepikhova, M., et al.Artigo em ata de conferênciaAcesso aberto