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| Data | Título | Autor(es) | Tipo | Acesso |
| 2014 | IBA study of SiGe/SiO2 nanostructured multilayers | Barradas, N. P.; Alves, E.; Vieira, E. M. F., et al. | Artigo | Acesso restrito UMinho |
| 2018 | In-situ XRD vs ex-situ vacuum annealing of tantalum oxynitride thin films: Assessments on the structural evolution | Cunha, L.; Apreutesei, M.; Moura, C., et al. | Artigo | Acesso restrito UMinho |
| 2008 | Influence of air oxidation on the properties of decorative NbOxNy coatings prepared by reactive gas pulsing | Chappé, J. M.; Carvalho, P.; Lanceros-Méndez, S., et al. | Artigo | Acesso restrito UMinho |
| 2019 | Influence of Al/Si atomic ratio on optical and electrical properties of magnetron sputtered Al1-xSixOy coatings | Costa, Pedro Miguel Pinto; Al-Rjoub, A.; Rebouta, L., et al. | Artigo | Acesso aberto |
| Set-2012 | Influence of annealing conditions on formation of regular lattices of voids and Ge quantum dots in amorphous alumina matrix | Pinto, S. R. C.; Buljan, Maja; Marques, L., et al. | Artigo | Acesso aberto |
| 2003 | Influence of crystals distribution on the photoluminescence properties of nanocrystalline silicon thin films | Cerqueira, M. F.; Stepikhova, M.; Losurdo, M., et al. | Artigo | Acesso aberto |
| Fev-2005 | Influence of nitrogen content on the structural, mechanical and electrical properties of TiN thin films | Vaz, F.; Ferreira, J. A.; Ribeiro, E., et al. | Artigo | Acesso aberto |
| 27-Mai-2008 | Influence of the chemical and electronic structure on the electrical behavior of zirconium oxynitride films | Carvalho, P.; Chappé, J. M.; Cunha, L., et al. | Artigo | Acesso aberto |
| 2011 | Influence of the deposition parameters on the growth of SiGe nanocrystals embedded in Al2O3 matrix | Vieira, E. M. F.; Pinto, S. R. C.; Levichev, S., et al. | Artigo | Acesso restrito UMinho |
| 26-Fev-2007 | Influence of the O/C ratio in the behaviour of TiCxOy thin films | Fernandes, A. C.; Vaz, F.; Rebouta, L., et al. | Artigo | Acesso aberto |
| Jun-2013 | Influence of thermal annealing on structural and optical properties of Au:TiO2 nanocomposite film | Marin, A.; Munteanu, D.; Alves, E., et al. | Artigo | Acesso restrito UMinho |
| 2003 | Interrelation between microstructure and optical properties of erbium-doped nanocrystalline thin films | Losurdo, M.; Cerqueira, M. F.; Alves, E., et al. | Artigo | Acesso aberto |
| 14-Abr-2011 | Low-temperature fabrication of layered self organized ge clusters by RF-sputtering | Pinto, S. R. C.; Rolo, Anabela G.; Buljan, M., et al. | Artigo | Acesso aberto |
| 2001 | Microstructure and mechanical properties of nanocomposite (Ti,Si,Al)N coatings | Carvalho, S.; Rebouta, L.; Cavaleiro, A., et al. | Artigo | Acesso aberto |
| Dez-2015 | Multifunctional Ti–Me (Me=Al, Cu) thin film systems for biomedical sensing devices | Lopes, Cláudia Jesus Ribeiro; Vieira, M.; Borges, Joel Nuno Pinto, et al. | Artigo | Acesso restrito UMinho |
| 2013 | On the formation of an interface amorphous layer in nanostructured ferroelectric Ba0.8Sr0.2TiO3 thin films integrated on Pt-Si and its effect on the electrical properties | Silva, J. P. B.; Sekhar, K. C.; Rodrigues, S. A. S., et al. | Artigo | Acesso restrito UMinho |
| 1-Jul-2017 | Optical and structural analysis of solar selective absorbing coatings based on AlSiOx:W cermets | Dias, D.; Rebouta, L.; Costa, P., et al. | Artigo | Acesso aberto |
| Ago-2011 | Optical properties of AlNxOy thin films deposited by DC magnetron sputtering | Borges, Joel Nuno Pinto; Alves, E.; Vaz, F., et al. | Artigo em ata de conferência | Acesso aberto |
| 2011 | Optical properties of AlNxOy thin films deposited by DC magnetron sputtering | Borges, Joel Nuno Pinto; Alves, E.; Vaz, F., et al. | Resumo em ata de conferência | Acesso restrito UMinho |
| 2015 | Optical properties of zirconium oxynitride films: the effect of composition, electronic and crystalline structures | Carvalho, P.; Borges, Joel Nuno Pinto; Rodrigues, M. S., et al. | Artigo | Acesso restrito UMinho |
