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Issue DateTitleAuthor(s)TypeAccess
2017Raman and IR-ATR spectroscopy studies of heteroepitaxial structures with a GaN:C top layerCerqueira, M. F.; Vieira, L. G.; Alves, A., et al.ArticleOpen access
2010Raman study of doped-ZnO thin films grown by rf sputteringCerqueira, M. F.; Rolo, Anabela G.; Viseu, T. M. R., et al.Conference paperOpen access
Sep-2015Raman study of insulating and conductive ZnO: (Al, Mn) thin filmsCerqueira, M. F.; Viseu, T. M. R.; Campos, J. Ayres de, et al.ArticleOpen access
2011Resonant raman scattering in ZnO : Mn and ZnO: Mn : Al thin films grown by RF sputteringCerqueira, M. F.; Vasilevskiy, Mikhail; Oliveira, Fernando, et al.ArticleOpen access
2018Rheology characterization of a solder pasteBarbosa, Flávia Vieira; Ribeiro, Pedro Emanuel Abreu; Cerqueira, M. F., et al.Conference paperRestricted access (UMinho)
May-2016Role of counter-ion and helper lipid content in the design and properties of nanocarrier systems: a biophysical study in 2D and 3D lipid assembliesOliveira, Ana Cristina Norberto Gonçalves; Nogueira, Sara S.; Goncalves, Odete, et al.ArticleOpen access
2010Room temperature paramagnetism of ZnO:Mn films grown by RF-sputteringOliveira, Filipe André; Cerqueira, M. F.; Vasilevskiy, Mikhail, et al.ArticleOpen access
2015Silicon nanowire arrays coupled with cobalt phosphide spheres as low-cost photocathodes for efficient solar hydrogen evolutionBao, Xiao-Qing; Cerqueira, M. F.; Alpuim, P., et al.ArticleOpen access
2015Solar selective absorbing coatings based on AlSiN/AlSiON/AlSiOy layersRebouta, L.; Sousa, A.; Andritschky, M., et al.ArticleOpen access
2001Spectroscopic ellipsometry study of the layer structure and impurity content in Er-doped nanocrystalline silicon thin filmsLosurdo, M.; Cerqueira, M. F.; Stepikhova, M., et al.ArticleOpen access
2009Structural and photoluminescence studies of erbium implanted nanocrystalline silicon thin filmsCerqueira, M. F.; Alpuim, P.; Filonovich, Sergej, et al.ArticleOpen access
19-Mar-2018Structural and vibrational properties of SnxGe1-x: Modeling and experimentsVasin, A. S.; Oliveira, F.; Cerqueira, M. F., et al.ArticleOpen access
1998Structural characterization of μc-Si:H films produced by R.F. magnetron sputteringCerqueira, M. F.; Ferreira, J. A.; Andritschky, M., et al.ArticleOpen access
2000Structural studies and influence of the structure on the electrical and optical properties of microcrystalline silicon thin films produced by RF sputteringCerqueira, M. F.; Ferreira, J. A.; Adriaenssens, G. J.ArticleOpen access
2006Study of the oxygen role in the photoluminescence of erbium doped nanocrystalline silicon embedded in a silicon amorphous matrixCerqueira, M. F.; Losurdo, M.; Monteiro, T., et al.ArticleOpen access
17-Apr-2013Study on excimer laser irradiation for controlled dehydrogenation and crystallization of boron doped hydrogenated amorphous/nanocrystalline silicon multilayersGontad, F.; Filonovich, Sergej; Cerqueira, M. F., et al.ArticleOpen access
2015A systematic study of the structural and magnetic properties of Mn-, Co-, and Ni-Doped Colloidal Fe3O4 nanoparticlesKolen’ko, Yury V.; Bañobre-López, Manuel; Deepak, Francis Leonard, et al.ArticleRestricted access (UMinho)
1999Temperature dependence of the first order Raman scattering in thin films of mc-Si:HCerqueira, M. F.; Ferreira, J. A.ArticleOpen access
2007The annealing effect on structural and optical properties of ZnO thin films produced by RF sputteringRolo, Anabela G.; Campos, J. Ayres de; Viseu, T. M. R., et al.ArticleOpen access
3-Aug-2013The effect of argon plasma treatment on the permeation barrier properties of silicon nitride layersMajee, Subimal; Cerqueira, M. F.; Tondelier, D., et al.ArticleOpen access